Tectronix AFG31000

Description

The Tektronix AFG31000 Series is a high-performance AFG with built-in arbitrary waveform generation, real-time waveform monitoring, and the largest touchscreen on the market. Providing advanced waveform generation and programming capabilities, waveform verification, and a modern touch-screen interface, the new AFG31000 is sure to delight and simplify the job of every researcher and engineer.

Key performance specifications

  • 1 or 2 channel models
  • Output amplitude range 1 mVP-P to 10`VP-P into 50`Ω loads
  • Basic (AFG) mode:
    • 25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
    • 250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
    • 14-bit vertical resolution
    • Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms
    • Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM)
  • Advanced (Sequence) mode:
    • Continuous mode (optional Sequence, Triggered and Gated modes)
    • 16 Mpts arbitrary waveform memory on each channel (128 Mpts optional)
    • Up to 256 steps in sequence mode with loop, jump and wait events
    • Variable sampling clock 1 µSa/s to 2 GSa/s

Key features

  • Patented InstaView™ technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance
  • Sequencing option adds the ability to program long, complex waveforms with up to 256 steps
  • The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings
  • Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC
  • Outputs are protected from over voltage and current to minimize potential instrument damage
  • Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs

Applications

  • Advanced research
  • Clock and system synchronization
  • Replication of real world signals
  • Component and circuit characterization and validation
  • Embedded circuit design and test
  • General purpose signal generation
  • Double pulse test

Basic and Advanced Modes

The AFG31000 series is the industry’s first arbitrary function generator with full function Basic (AFG) and Advanced (Sequence) modes.

In Basic mode, the AFG31000 generates traditional functions and arbitrary waveforms. The touchscreen and front-panel controls make it simple to set up.

Basic mode lets you change frequency without the need to worry about waveform length and sample rate. This feature is useful in analog designs that characterize filter/amplifier frequency responses or in digital designs where clock rates change frequently.

Key settings are visible at a glance, and are easy to adjust using touch, numeric keypad, or rotary controls

New with the AFG31000, Advanced mode provides the ability to generate multiple waveforms with complex timing. In this mode, you can compose a list (or a sequence) of 1 to 256 waveforms, with total waveform length up to 16 Mpts/ch (128 Mpts/ch optional) and define the ouput sequence of these waveforms. Repeat, go-to, wait, jump, and triggered events are all supported and the large memory provides space to store many waveforms or long waveforms.

This feature is very useful in applications where many test cases need to be performed sequentially. Instead of loading the test cases one by one, you can put all of them in a sequence and load at one time, switching from one to another seamlessly to greatly improve the test efficiency.

Additionally, Advanced mode uses variable sample rate technology. Every sample in a waveform is output once and only once in each cycle, synchronized to the sample rate. Since there is no skipping or repetition, all details in the waveforms are kept. This feature is very useful for applications in which signal fidelity is extremely critical, such as IQ modulation and pulse train generation.

InstaView™ technology shows the actual waveform at the DUT

Most waveform generators assume they are driving a 50 Ω impedance. However, most devices under test do not have a 50 Ω impedance. This mismatch results in an inconsistency between the waveform as set on the AFG and the signal at the DUT.

With InstaView turned off, the AFG31000 works like a traditional function generator. Due to an impedance mismatch, the AFG display shows a different waveform from the one observed at the DUT.

With the patented InstaView ™ technology, the AFG31000 Series can display the actual waveform at the DUT, instead of just the nominal waveform as set on the AFG. The waveform displayed on the AFG instantly responds to changes in frequency, amplitude, waveform shape, and impedance changes at the DUT. InstaView helps eliminate the uncertainty and measurement risk caused by impedance mismatches, without requiring additional cables, instruments, or effort.

A large touch screen and smart user interface

The large 9-inch capacitive touch screen displays all related settings and parameters on a single screen. Similar to smart devices, you can tap or swipe to easily select, browse, locate and change settings and parameters. Frequently-used functions are immediately accessible. Familiar buttons and rotary knob controls are available for more traditional navigation.

Automate testing with Kickstart software

Use Kickstart to control your AFG31000 remotely and set up automated tests in four easy steps:

  1. Select the AFG application.
  2. Set up your instrument by selecting an AFG model and name (for example, My AFG31252).
  3. Enter the test parameters.
  4. Enable output to initiate signal generation.

 

Kickstart provides built-in common waveforms like sine, square, pulse, ramp, and noise that you can simulate, or load a custom arbitrary function from a file on your PC or from the AFG. Then capture, export, and save your waveform settings.

Easily align and swap parameters between channels using the InterChannel settings for AFGs and tests utilizing two channels.

Save the test parameters to visit later or take a screenshot of the tables and graphs directly from Kickstart to use in your test reports.

Add the AFG application to your Kickstart applications for Source Measure Units, Oscilloscopes, Data Acquisition Units, DMMs, and power supplies to complete your automated bench test solution. Learn more by visiting https://www.tek.com/en/products/keithley/keithley-control-software-bench-instruments/kickstart.

Built-in ArbBuilder tool makes creating and editing arbitrary waveforms easier than ever

ArbBuilder is a built-in application on the AFG31000 series that lets you create and edit your arbitrary waveforms directly on the generator. You can create arbitrary waveforms with the Equation Editor tool or start from a library of standard templates. Thanks to the large capacitive touch screen, you can drag, pinch and zoom to get the detail you need.

You can quickly replicate real-world waveforms captured with oscilloscopes or created by third-party software by loading CSV format data files directly into ArbBuilder from a USB memory stick.

Simplified multi-unit synchronization

Most applications need one or two channels of output, but some applications require more channels. For example, in order to simulate 3-phase power signals, engineers often need to synchronize three 2-channel generators; one for the voltage and current on each phase. To do this used to be time-consuming, as it required many cable connections between the AFG units, and making changes in deep branches of the menu trees on all instruments.

The AFG31000 simplifies this process with an onscreen wizard that leads you through the process of making cable connections and configuring settings to synchronize multiple generators.

Double Pulse Test

The AFG31000 includes Double PulseTest, a downloadable plugin software application that enables double pulse applications for the power and semiconductor markets. The Double Pulse Test user interface provides touch-and-swipe or point-and-click control for generating at least two varying pulse widths. These pulses can be output to an isolated gate driver to trigger power devices such as MOSFETs or IGBTs.

Key features

  • Ready-to-use, ease of use, built-in applications that reduce test development time
  • Generate pulses with varying pulse widths
  • Pulse widths from 20 ns to 150 μs
  • GUI and large touchscreen display
  • Multi-triggers method: Manual, Continuous and External
  • Up to 30 pulses
  • Ohm or High Z output modes
  • Free to download from the website
  • Works on all of the AFG31000 Series models

 

Reduce development time with ready-to-use, built-in applications

The Double Pulse Test on the AFG31000 offers the design and test engineer the ability to generate voltage pulses with varying pulse widths onto their DUTs. The design and test engineers are able to perform the Double Pulse Test in less than one minute, saving them hours when compared to using a PC software or a microcontroller to perform the test with varying configurations.

Typical applications

  • R&D engineer and test engineer of semiconductor industry (power device and power module with SiC/GaN/Si)
  • Automotive industry (EV, EHV, FCV), laboratory and university of power electronics
  • Power device manufacturer
  • Heavy user of power device and module
  • Inverter and motor drive system

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